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Field-emission Scanning Electron Microscope
Model Information
- LEO/Zeiss Field-emission SEM
Specifications
- Field-emission tip for high-contrast, high-resolution imaging
- 1-20 kV operating voltage reduces damage
- Backscatter detector for imaging secondary electrons
- Chromium and platinum evaporators
- Critical point drying accessories
- Resolution 40-50 times better than conventional SEM
Applications:
- Surface examination of cells, substrates, tissues, and embryos
Examples:
Fimbria connecting E coli bacteria
Cell grown on posts of synthetic substrate
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