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Field-emission Scanning Electron Microscope

Model Information

  • LEO/Zeiss Field-emission SEM

Specifications

  • Field-emission tip for high-contrast, high-resolution imaging
  • 1-20 kV operating voltage reduces damage
  • Backscatter detector for imaging secondary electrons
  • Chromium and platinum evaporators
  • Critical point drying accessories
  • Resolution 40-50 times better than conventional SEM

Applications:

  • Surface examination of cells, substrates, tissues, and embryos

Examples:


Fimbria connecting E coli bacteria


Cell grown on posts of synthetic substrate


Zeiss
www.leo-usa.com

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